This report describes a metrology plan that was developed for the characterization of PLZT-based devices, such as the Adjustable Focus Optical Correction Lens (AFOCL) in support of and as part of the deliverables for NASA contract NAS8-00118. The areas to be investigated include intensiometric effects (those that limit or alter the intensity of the light transmitted through the optic); interferometric effects (the phase change induced through the optic); and polarimetric effects (evaluating the differential lag between two polarization states propagating through the optic). These distinct phenomena are often coupled together in real applications consequently, there is a need to develop different standardized testing apparatus to: (1) isolate one effect from another; (2) gather information for understanding the physical effects; (3) anchor wavefront corrector modeling efforts; (4) develop the ability to decouple different effects; (5) demonstrate the suitability of PLZT technology to perform wavefront correction. The Center for Applied Optics (CAO) at the University of Alabama in Huntsville (UAH) is skilled in the characterization of transmission wavefront shaping devices using traditional interferometers available within the CAO Optical Metrology Laboratory and their Advanced Polarization Test Facility. Besides the imaging and interferometers available, the polarimetry facility has at its disposal, a Mueller Matrix Imaging Polarimeter (MMIP) which is well suited to the characterization of SLMs, polarizers, and thin film coatings within the visible and near-IR spectrums. In addition, the phase-shifting interferometry facilities at NASA-MSFC and the unique interferometers they processes are some of the most advanced available and may be of value especially for performing real-time optical performance evaluation of AFOCL test components.